nanoXCT: 3D X-ray Tomography of STM Tungsten Tip

This application note demonstrates the high resolution of the nanoXCT™ from imaging of Scanning Transmission Microscope (STM) solid 1.2 um Tungsten Tip. The tungsten tip was imaged on a nanoXCT in transmission geometry with a Cu 8 kV x-ray source utilizing Zernike Phase Contrast Imaging. Typical spatial resolution from the nanoXCT is sub- 50 nm The system can be utilized to image both Low and High Z materials