nanoPi™

The new nanoPi is an innovative turn-key X-ray imaging tool with powerful capabilites and a diversity of applications ranging from materials science to biology. Jointly developed by Xradia and a team of scientists at Argonne National Laboratory, IL, USA, the nanoPi provides nondestructive element-specific imaging at sub-30 nm resolution. The powerful combination of a scanning X-ray microscope with a full-field X-ray microscope puts the nanoPi at the forefront of research in which both high-resolution and high-sensitivity are essential.

In the scanning mode the zone plate generates a nanoprobe that is designed for fluorescence mapping, chemical mapping using XANES contrast, or nano-diffraction. In the full-field mode the instrument is ideally suited for tomographic data collection for 3D imaging. .

nanoPi  Technology
The ultrahigh resolution of the nanoPi requires excellent mechanical stability on the components that hold the specimen and the optics. This level of stability is maintained with custom-developed high-stiffness translation stages along with the use of low thermal expansion materials. A novel, patented laser encoder system measures the relative movement between the optics and the sample with Å resolution readout, correcting for potential vibrations and drifts. A specially-designed high-stiffness flexure stage then corrects for any displacement.

nanoPi Technical Specifications:

X-ray energy	0.2 – 50 keV
Imaging resolution	< 30 nm
Laser encoder system	Doppler Displacement Meter
Laser encoder readout resolution	< 0.2 nm
Laser encoder readout frequency	> 5 kHz
Flexure stage update frequency	400 Hz
Relative position stability between sample and objective (closed loop)	3 nm rms