Resolution & Calibration Targets

Xradia Inc. offers test patterns for calibrating and evaluating the spatial resolution and performance of x-ray imaging systems. The test pattern is fabricated using the same process that enables the manufacture of Xradia’s zone plate lenses that have the highest performance in terms of spatial resolution and focusing efficiency for multi-keV and high-energy x-ray imaging/focusing applications. The test patterns have a variety of structures that enable resolution tests, modulation transfer measurements, length scale calibration and field distortion measurements.

Model: X50-30-2

The finest feature size on the pattern is 50 nm. All test structures are labeled for easy identification.

 

Model: X500-200-30

The finest feature size on the pattern is 500 nm. All test structures are labeled for easy identification. The large thickness of this pattern is ideal for high-energy x-ray applications above 10 keV.

Order And Price Information

Model	Specifications
	Structure Material	Smallest Feature (nm)	Star Diameter (μm)	Structure Height (nm)
X50-30-2	Gold	50	30	180nm +/- 10%
X500-200-30	Gold	500	200	3000nm

Notes: The test pattern is fabricated on a free standing, low stress Si3N4 membrane with a thickness of 100-120 nm (X50-30-2) and 330 nm (X500-200-30). Delivery 3-4 Weeks ARO.

* For pricing and shipment please kindly contact us at sales@xradia.com or call 925-288-1228 ext 1114.