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MRS Fall, Boston, MA – November 27, 2012 – Xradia, Inc., the world's leading manufacturer of high resolution 3D X-ray microscopes, announced its new Scout-and-Scan™ Control Software for VersaXRM instruments. The new, easy-to-use control system is ideal in a multi-user setting where users have a wide variety of experience. The new control system maintains the flexibility for which the VersaXRM system is known, making set-up of scans even easier.
The intuitive workflow environment enables users to easily scout their region of interest and select scanning parameters. The new software also offers recipe-based repeatability, which is especially useful for in situ and 4D research, and also enables greater control and efficiency for future work. Additionally, a window in the control panel always provides a clear view of the sample being imaged. The new control system was especially created for the multi-user environment, from the central imaging laboratories of academia hosting professors and senior researchers through students of various levels, or the semiconductor failure analysis lab that serves a wide range of experience factors.
Howard Marks, Director of Silicon Technology Failure Analysis at NVIDIA, praised the speediness of the new control system: "With the old software, it took me more than 30 minutes to set up and create a recipe. With the new Scout-and-Scan control system, I can do it in 15 minutes or less. For our team, this translates to more efficient use of the system, making it even easier to get relevant results in a timely manner for our failure analysis work with the VersaXRM."
Scout-and-Scan offers super simple steps for set-up:
Scout-and-Scan is offered as a free upgrade to existing VersaXRM customers under warranty or service contract, and will be provided during customers' next regularly scheduled product maintenance visit. The new software will be available in the first quarter of 2013.
Xradia designs and manufactures microscopes for industrial and academic research applications. Xradia's solutions offer unparalleled high contrast and high resolution imaging capabilities for a large range of sample sizes and shapes. The company's heritage began in the synchrotron and extends to the laboratory. Xradia's laboratory product families, the UltraXRM-L and VersaXRM™, together offer a multi-length scale solution delivering full volume 3D imaging with resolution down to 50 nm. Additional information can be found at www.xradia.com.
Xradia, VersaXRM and Scout-and-Scan are trademarks of Xradia Inc. Other trademarks that may be mentioned in this release are the intellectual property of their respective owners.
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